Abstract:Optical wavefront engineering has been rapidly developing in fundamentals from phase accumulation in the optical path to the electromagnetic resonances of confined nanomodes in optical metasurfaces. However, the amplitude modulation of light has limited approaches that usually originate from the ohmic loss and absorptive dissipation of materials. Here, an atomically thin photon-sieve platform made of MoS2 multilayers is demonstrated for high-quality optical nanodevices, assisted fundamentally by strong excitonic resonances at the band-nesting region of MoS2. The atomic thin MoS2 significantly facilitates high transmission of the sieved photons and high-fidelity nanofabrication. A proof-of-concept two-dimensional (2D) nanosieve hologram exhibits 10-fold enhanced efficiency compared with its non-2D counterparts. Furthermore, a supercritical 2D lens with its focal spot breaking diffraction limit is developed to exhibit experimentally far-field label-free aberrationless imaging with a resolution of ∼0.44λ at λ = 450 nm in air. This transition-metal-dichalcogenide (TMDC) photonic platform opens new opportunities toward future 2D meta-optics and nanophotonics.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acs.nanolett.0c02712?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acs.nanolett.0c02712</a>.Growth of MoS2 layers; fabrication; hologram design; experimental setup; efficiency measurement; lens design; 2D SCL scanning confocal microscopy; absorbance spectra of PVD-grown MoS2 samples; sketches of measuring the total efficiency of the 2D nanosieve hologram; simulated SCL intensity profiles at the x–z plane; background effects caused by transmitted light from the unpatterned film in hologram; a comparison between the simulated and experimental results for these microscopies (BF, SCM, and 2D lens SCM) under coherent illumination; imaging results by using incoherent bright-field microscopy; a comparison between the simulated and experimental results for these microscopies (BF, SCM, and 2D lens SCM) under incoherent conditions; size effect of pinhole in a traditional incoherent scanning confocal microscopy; dimension of designed SCL (<a class="ext-link" href="/doi/suppl/10.1021/acs.nanolett.0c02712/suppl_file/nl0c02712_si_001.pdf">PDF</a>)This article has not yet been cited by other publications.

Hyperspectral imaging of complex dielectric functions in 2D materials

Deterministic reflection contrast ellipsometry for thick multilayer two-dimensional heterostructures

Mapping nanoscale charge states and phase domains with quantitative hyperspectral coherent diffractive imaging spectroscopy

Hyperspectral photoluminescence and reflectance microscopy of 2D materials

Probing the Local Dielectric Function by Near Field Optical Microscopy Operating in the Visible Spectral Range

Imaging of Interlayer Coupling in van der Waals Heterostructures Using a Bright-Field Optical Microscope

Crescent-shaped Shadow of Second Harmonic Generation in Dielectric Microsphere/tmd Monolayer Heterostructure

Imaging of phase change materials below a capping layer using correlative infrared near-field microscopy and electron microscopy

Electron Ptychographic Phase Imaging of Beam-sensitive All-inorganic Halide Perovskites Using Four-dimensional Scanning Transmission Electron Microscopy

Optical signatures of charge- and energy transfer in TMDC/TMDC and TMDC/perovskite heterostructures

Inspection of Line Defects in Transition Metal Dichalcogenides Using a Microscopic Hyperspectral Imaging Technique.

High resolution imaging of reconstructed domains and moire patterns in functional van der Waals heterostructure devices

Electron Channelling Contrast SEM Imaging of Twist Domains in Transition Metal Dichalcogenide Heterostructures

Direct Optical-Structure Correlation in Atomically Thin Dichalcogenides and Heterostructures

Exciton-Enabled Meta-Optics in Two-Dimensional Transition Metal Dichalcogenides

Imaging exciton interactions in two-dimensional materials and heterostructures with spectroscopic microscopy

Element-specific, non-destructive profiling of layered heterostructures

Visualization of Band Shifting and Interlayer Coupling in WxMo1-xS2 Alloys using Near-Field Broadband Absorption Microscopy

Spectrally resolved free electron-light coupling strength in a transition metal dichalcogenide

Super-resolved Discrimination of Nanoscale Defects in Low-Dimensional Materials by Near-Field Photoluminescence Spectral Imaging

Polariton hyperspectral imaging of two-dimensional semiconductor crystals