Abstract:The sine wave test of an analog-to-digital converter (ADC) means to excite the ADC with a pure sine wave, look for the sine wave which best fits the output in least squares (LS) sense, and analyze the difference. This is described in the IEEE standards 1241–2000 and 1057–1994. Least squares is the “best” fitting method most of us can imagine, and it yields very good results indeed. Its known properties are achieved when the error (the deviation of the samples from the true sine wave) is random, white (the error samples are all independent), with zero mean Gaussian distribution. Then, the LS fit coincides with the maximum likelihood estimate of the parameters. However, in sine wave testing of ADCs, these assumptions are far from being true. The quantization error is partly deterministic, and the sample values are strongly interdependent. For sine waves covering less than, say, 20 quantum levels, this makes the sine wave fit worse than expected, and since small changes in the sine wave affect the residuals significantly, especially close to the peaks, ADC error analysis may become misleading. Processing of the residuals [e.g., the calculation of the effective number of bits, (ENOB)] can exhibit serious errors. This paper describes this phenomenon, analyzes its consequences, and suggests modified processing of samples and residuals to reduce the errors to negligible level.

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ADC Jitter Estimation Using a Single Frequency Test Without Requiring Coherent Sampling

Accurate and Cost-Effective Technique for Jitter and Noise Separation Based on Single-Frequency Measurement

An Accurate and Cost-Effective Jitter Measurement Technique Using a Single Test Frequency.

Fast & Accurate Algorithm for Jitter Test with a Single Frequency Test Signal

Measurement of Clock Jitter and Distribution with Pico-Second Resolution Using ADC

Comparison of Clock Jitter Measurement Methods Using ADC Sampling

Clock Jitter Measurement Method

Analysis and Design of Low-Jitter Clock Driver for Wideband ADC

Simulation Research on Jitter Measurement Using CDF of ADC Output Code

Methodology for Digital Synthesis of Deterministic and Random Jitter Generation on Rising or Falling Edges of Data Pattern

Research on Analog-to-Digital Converter (ADC) Dynamic Parameter Method Based on the Sinusoidal Test Signal

Low cost high accuracy method for testing A/D dynamic parameters

ADC Parameter Test Based on Improved Maximum Likelihood Estimation

Improved Determination of the Best Fitting Sine Wave in ADC Testing

Windows for ADC dynamic testing via frequency-domain analysis

Estimation of Broadband Time-Interleaved ADC's Impairments and Performance Using Only Single-Tone Measurements.

A/D Converter INL and DNL Estimation with a Distorted Sinusoidal Stimulus Signal

Time jitter generation and injection algorithms for high-speed applications

Accurate Exponential Histogram Test Method for ADC Linearity Test