Abstract:The ever-increasing demand for high-density nonvolatile memory devices has led to the widespread adoption of 3-D triple-level cell (TLC) NAND flash memory. TLC NAND flash cut stored voltage levels into eight, shrinking the gaps between levels and dramatically impacting flash reliability. The high-density 3-D TLC flash structure increases the likelihood of data errors and cell-to-cell (C2C) interference becomes in three dimensions. The reliability is further degraded with every write/erase (W/E) cycle. However, the written data is the primary parameter in the reliability of many reliability threats. To this end, we utilize the state-of-the-art 3-D TLC NAND flash technology to characterize the impact of data on flash reliability experimentally. This work proposes a novel data-aware (DA) optimization technique to suppress errors in 3-D TLC NAND flash memory by improving the flash's reliability based on page type, content, and technology. The technique exploits the data contents to suppress the degradation caused by every W/E cycle and mitigates the layer-to-layer variations by restructuring the data into a more reliable form. Such a technique aims to improve reliability and extend the lifetime of memory devices, making them more viable for high-reliability applications. Experimental evaluation shows that our technique can suppress the error bit count (EBC) by up to 60% and 45% on average over the nominal lifetime of the NAND flash, thereby improving flash lifetime by 55%, on average. Moreover, the technique can mitigate the layer-to-layer variations when spatially employed on specific layers, lowering EBC by 50%.

A Novel Hot Data Identification Mechanism for NAND Flash Memory.

A Novel Hot-cold Data Identification Mechanism Based on Multidimensional Data

Identification Method of Hot Data for Multi-bank Flash Storage Architecture

Exploiting Cross-Layer Hotness Identification To Improve Flash Memory System Performance

HOTIS: A Hot Data Identification Scheme to Optimize Garbage Collection of SSDs

Data Placement Through Clustering Sequential Writes and Isolating Cold Pages for Write Amplification Reduction in NAND Flash Memory

Latency Variation Aware Read Performance Optimization on 3D High Density NAND Flash Memory.

A Light-Weight Hot Data Identification Scheme via Grouping-based LRU Lists

TCSE: A Target Cell States Elimination Coding Strategy for Highly Reliable Data Storage Based on 3-D NAND Flash Memory

Hotness-aware Buffer Management for Flash-Based Hybrid Storage Systems.

Architectural Techniques for Improving NAND Flash Memory Reliability

Study Of Intercell Trapped Charge For Data Retention Improvement In 3d Nand Flash Memory

An Effective Dynamic Wear Leveling In The Application Of Solid State Drives

HSWL: an Efficient Hash-Based Static Wear Leveling Algorithm

LIAD: A Method for Extending the Effective Time of 3-D TLC NAND Flash Hard Decision

Adaptive Bitline Voltage Countermeasure for Neighbor Wordline Interference in 3D NAND Flash Memory-Based Sensors

Modeling Retention Errors of 3D NAND Flash for Optimizing Data Placement

Analysis and Optimization of Temporary Read Errors in 3D NAND Flash Memories

Data-Aware 3-D TLC NAND flash Memory Reliability Optimization

Exploiting Latency Variation for Access Conflict Reduction of NAND Flash Memory

Impact Of Self-Heating Effect On The Retention Of 3-D Nand Flash Memory