Further process of polarization within a pixellated CdZnTe detector under intense x-ray irradiation

xi wang,shali xiao,miao li,liuqiang zhang,yulin cao,yuxiao chen
DOI: https://doi.org/10.1016/j.nima.2012.10.037
2013-01-01
Abstract:It has been observed that pixellated CdZnTe detectors fabricated from crystals experience an extending of space charge region in the polarized state when exposed to a high flux of x-rays and a low flux of x-rays. In this case, in some areas of the CZT detector polarization occurs without high incident flux. Results from these studies reveal that at very high photon flux rates, a space charge region with high density develops and extends, consistent with the accumulation of positive space charge due to the trapping of free-carrier holes created by the x-ray irradiation. The extending of space charge region observed without high x-ray has a direct influence on the irradiation hardness and charge collection efficiency of the devices.
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