Abstract:The NiO dispersion phase on three different supports have been studied by EXAFS in combination with XRD quantitative phase analysis. The result of XRD shows the threshold of NiO/gamma-Al2O3 system is larger than that of NiO/TiO2 system and the threshold of NiO/SiO2 system is the least. From the FT functions of EXAFS for samples we can find that in NiO/gamma-Al2O3 system a part of Ni changes its coordination polyhedra into tetrahedra, the Ni-Ni coordination peaks reduce markedly with the decrease of NiO content in samples. The result of EXAFS fitting and phase isolation shows Ni-Ni coordination number increases with the increase of NiO content in samples of NiO Al2O3 system and reaches a maximum value of 4.0 and remains constant when NiO content reaches the threshold obtained by XRD. It shows the lire of NiO dispersion phase is in better agreement with the NiO monolayer dispersion model than any other models.In FT functions of EXAFS for samples at thresholds of two systems the Ni-Ni coordination peaks of NiO/TiO2 system is much lower than those of NiO Al2O3 system. But they are similar when their NiO contents both close to the threshold of NiO TiO2 system. It shows that though the dispersion capacity of NiO in NiO TiO2 system is less than that in NiO/gamma-Al2O3 system its dispersion performance is better.In NiO/SiO2 system the coordination peaks are similar to these of pure NiO and the Ni-Ni coordination number approaches 12 of the pure NiO. It shows it is difficult for NiO to disperse on the surface of SiO2. In fact, for the NiO/SiO2 system the threshold obtained by XRD is beyond the experiment accuracy so there is no threshold for this system.Therefore above facts indicate that dispersion threshold and reducing of metal-metal coordination number of the dispersion phase is a quite characteristic feature of monolayer dispersion state.

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