Abstract:Material properties are linked to microstructure, e.g. grain size, grain orientation, phase distribution etc. Accurate crystallographic assignment of phases is critical for correctly assessing properties such as stress and strain in geological materials. In particular, α-quartz (P3121 or P3221) single crystals are prone to various types of twinning, which can lead to ambiguity in grain orientation assignment. Dauphine law twins are a common type of α-quartz twin, where domains with the same chirality intergrow but are distinguishable by a 60° rotation about the c axis of the trigonal unit cell. Proper assignment of single crystal orientation is crucial to accurately determining the stress tensor of the crystal, where misindexation can lead to large errors along the ab plane. At the Advanced Light Source beamline 12.3.2, we have developed energy dispersive diffraction (Laue) coupled with elemental identification using x-ray fluorescence (XRF) with 1-2 um beam size. We use this setup to generate 2D grain maps of polished natural quartz boudin samples from the Bastogne region of Belgium, with dimensions ranging from 160 x 100 um and 1 um step size to 4500 x 2600 um and 20 um step size. Macroscopically, these samples consist of alternating psammite (metamorphic fine-grained sandstone rock) and quartz. We determine quartz grain orientation in these samples unambiguously by using a statistical analysis of peak intensity as a function of indexed orientation in reflections with no harmonic overlap. We then calculate the strain tensor of each Laue pattern (~30,000 in the largest map) and find that all grains display elastic shortening perpendicular to the quartz vein walls, irrespective of grain direction. This indicates that boudinage forms through layer-parallel shortening, contrary to previously held beliefs. This study demonstrates how Laue diffraction can act as a fast, definitive and detailed tool in measurements of rock or mineral deformation.

Determination of Deviatoric Elastic Strain and Lattice Orientation by Applying Digital Image Correlation to Laue Microdiffraction Images: the Enhanced Laue-Dic Method

Laue-Dic: A New Method For Improved Stress Field Measurements At The Micrometer Scale

Accuracy of Stress Measurement by Laue Microdiffraction (Laue-Dic Method): the Influence of Image Noise, Calibration Errors and Spot Number

Estimation of Elastic Strain by Integrated Image Correlation on Electron Diffraction Patterns.

Lattice strain and tilt mapping in stressed Ge microstructures using X-ray Laue micro-diffraction and rainbow-filtering

Intermitted 3D diffraction tomography combined with in situ Laue diffraction to characterize dislocation structures and stress fields in micro bending cantilevers

Alignment of Sample Position and Rotation During in Situ Synchrotron X-ray Micro-Diffraction Experiments Using a Laue Cross-Correlation Approach

Surface Patterning for Combined Digital Image Correlation and Electron Backscatter Diffraction In-Situ Deformation Experiments

Diffraction-Based Multiscale Residual Strain Measurements

A New Method to Reliably Determine Elastic Strain of Various Crystal Structures from Atomic-Resolution Images

A tunable multi-color "rainbow" filter for improved stress and dislocation density field mapping in polycrystals using x-ray Laue microdiffraction

Refinements for Bragg coherent X-ray diffraction imaging: Electron backscatter diffraction alignment and strain field computation

Application of Digital Image Correlation (DIC) to the Measurement of Strain Concentration of a PVA Dual-Crosslink Hydrogel Under Large Deformation

Determination of Three-Dimensional Interfacial Strain — A Novel Method of Probing Interface Structure with X-ray Bragg-surface Diffraction

Application of Digital Image Correlation Method to In-Situ Dynamic Strain Measurement

Applications of Laue Diffraction in Rock Deformation Measurements

HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale

Full-Field Strain Measurement Based on Least-Square Fitting of Local Displacement for Digital Image Correlation Method

Unambiguous indexing of trigonal crystals from white‐beam Laue diffraction patterns: application to Dauphiné twinning and lattice stress mapping in deformed quartz

Full Picture of Lattice Deformation in a Ge1 - xSnx Micro-Disk by 5D X-ray Diffraction Microscopy

Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation