Abstract:Even when aberration-corrected electron microscopy is in the ascendant, the microstructural analysis of materials faces the problems of residual aberrations, zone-axis deviation, surface damage, and irradiation damage, which not only have kept the spatial resolution of the electron microscope at about 0.5 Å for years, but also limited the reliability and accuracy of the microstructural analysis. Electron ptychography is a computational imaging method that utilizes the rich information in four-dimensional scanning transmission electron microscopy datasets to obtain high spatial resolution, phase accuracy, and dose efficiency. Recently, the information limit of microscopic imaging has reached 0.14? by local-orbital ptychography. Electron ptychography consists of two stages: data acquisition and numerical reconstruction. In the data acquisition stage, a four-dimensional scanning transmission electron microscopy dataset is formed by recording the two-dimensional diffraction patterns at each position by means of a pixelated detector during the two-dimensional scanning of the electron beam on the sample. In the numerical reconstruction stage, the amplitude and phase of the sample are retrieved from these datasets by means of suitable algorithms. In contrast to aberration correction, which reduces the effect of lens aberrations on the imaging quality, electron ptychography eliminates this effect and achieves aberration-free imaging, reproducing the true structure of the sample nearly perfectly. We briefly introduce the basic principles and algorithms of electron ptychography from the perspective of the main problems faced by the microstructure analysis of materials, and introduce the main features of electron ptychography through application examples.

Quantitative Z-Contrast Imaging In The Scanning Transmission Electron Microscope With Size-Selected Clusters

Image Scanning Fluorescence Emission Difference Microscopy Based On A Detector Array

Study of grey level threshold selection of TEM images of Au-MgF2 cluster film

Optimization for Imaging Through Scattering Media for Confocal Microscopes with Divided Elliptical Apertures.

Intensity calibration and atomic imaging of size-selected Au and Pd clusters in aberration-corrected HAADF-STEM

Space rocks and optimising scanning electron channelling contrast

Standardization and quantification of backscattered electron imaging in scanning electron microscopy

Phase imaging in scanning transmission electron microscopy using bright-field balanced divergency method

Interpretable and efficient contrast in scanning transmission electron microscopy with a diffraction grating beamsplitter

Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X‐ray Spectroscopy

Digital Dark Field -- Higher Contrast and Greater Specificity Dark Field Imaging using a 4DSTEM Approach

Three-dimensional atomic-scale structure of size-selected nanoclusters on surfaces

Effects of Electron Microscope Parameters and Sample Thickness on High Angle Annular Dark Field Imaging

Introduction to Electron Ptychography for Materials Scientists

Effective Object Planes for Aberration-Corrected Transmission Electron Microscopy

Performance Analysis of Quantitative Phase Retrieval Method in Zernike Phase Contrast X-ray Microscopy

Bright-field imaging of compound semiconductors using aberration-corrected scanning transmission electron microscopy

Geometric aspects of lattice contrast visibility in nanocrystalline materials using HAADF STEM

Dynamical Diffraction of High-Energy Electrons Investigated by Focal Series Momentum-Resolved Scanning Transmission Electron Microscopy at Atomic Resolution.

Experiments on bright-field and dark-field high-energy electron imaging with thick target material

Contrast in Atomically Resolved EF-SCEM Imaging