Characterization of Alpha/Beta Interface Structure in a Titanium Alloy Using Aberration-Corrected Scanning Transmission Electron Microscope

Y. Zheng,R. E. A. Williams,H. L. Fraser
DOI: https://doi.org/10.1017/s1431927616010710
IF: 4.0991
2016-01-01
Microscopy and Microanalysis
Abstract:Journal Article Characterization of Alpha/Beta Interface Structure in a Titanium Alloy Using Aberration-Corrected Scanning Transmission Electron Microscope Get access Yufeng Zheng, Yufeng Zheng Department of Materials Science and Engineering, The Ohio State University Search for other works by this author on: Oxford Academic Google Scholar Robert E A Williams, Robert E A Williams Department of Materials Science and Engineering, The Ohio State University Search for other works by this author on: Oxford Academic Google Scholar William AT Clark, William AT Clark Department of Materials Science and Engineering, The Ohio State University Search for other works by this author on: Oxford Academic Google Scholar Hamish L Fraser Hamish L Fraser Department of Materials Science and Engineering, The Ohio State University Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 1974–1975, https://doi.org/10.1017/S1431927616010710 Published: 25 July 2016
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