3D Electron Ptychography
Si Gao,Zhiyuan Ding,Xiaoqing Pan,Angus I. Kirkland,Peng Wang
DOI: https://doi.org/10.1017/s1431927619009747
IF: 4.0991
2019-01-01
Microscopy and Microanalysis
Abstract:Journal Article 3D Electron Ptychography Get access Si Gao, Si Gao National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, People's Republic of China Search for other works by this author on: Oxford Academic Google Scholar Zhiyuan Ding, Zhiyuan Ding National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, People's Republic of China Search for other works by this author on: Oxford Academic Google Scholar Xiaoqing Pan, Xiaoqing Pan Department of Chemical Engineering and Materials Science and Department of Physics and Astronomy, University of California, Irvine, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Angus I Kirkland, Angus I Kirkland Department of Materials, University of Oxford, Parks Road, Oxford, UKElectron Physical Sciences Imaging Centre, Diamond Lightsource Ltd., Diamond House, U.K. Search for other works by this author on: Oxford Academic Google Scholar Peng Wang Peng Wang National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, People's Republic of ChinaJEOL Ltd, 1-2 Mushashino, 3-Chome, Akishima, Tokyo, Japan Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 1802–1803, https://doi.org/10.1017/S1431927619009747 Published: 01 August 2019