An Improved DC Model for AlGaN/GaN HEMTs

Li Shen,Bo Chen,Ling Sun,Danting Luo,Jianjun Gao
DOI: https://doi.org/10.1002/mop.29008
IF: 1.311
2015-01-01
Microwave and Optical Technology Letters
Abstract:An Improved empirical model for the DC I-V characteristics of a GaN High electron mobility transistor HEMT) is presented in this article. The improvement consists in allowing the Curtice model parameters to vary with gate-source voltage. Model parameter extraction is made for a 100 mu m gate-width GaN HEMT. A good agreement is obtained between modeled results and measured results. (C) 2015 Wiley Periodicals, Inc.
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