Phase Invalidity Identification Framework with the Temporal Phase Unwrapping Method

Lei Huang,Anand Krishna Asundi
DOI: https://doi.org/10.1088/0957-0233/22/3/035304
IF: 2.398
2011-01-01
Measurement Science and Technology
Abstract:Phase retrieval from fringe patterns is widely used in optical metrology. In profilometry for example, precise phase values allow three-dimensional coordinate data with higher accuracy to be determined. The phase-shifting method coupled with temporal phase unwrapping provides not only the unwrapped phase, but also gives the modulation map, root mean square errors of least-squares fitting, and phase relationship between two neighboring pixels, which can be used for phase error identification. A practical invalid phase identification framework is presented to automatically identify the invalid measuring points with threshold selection and criterion testing. Experimental results show the practical feasibility of the proposed framework.
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