Development of an Advanced Sample‐Scanning Stage System Prototype for an MLL‐Based Hard X‐ray Nanoprobe

D. Shu,J. Maser,Y. Chu,H. Yan,E. Nazaretski,S. O'Hara,S. Kearney,J. Anton,J. Quintana,Q. Shen
DOI: https://doi.org/10.1063/1.3625325
2011-01-01
Abstract:The scientists and engineers at Argonne and Brookhaven are collaborating to develop a new nanopositioning system for the NSLS-II Hard X-ray Nanoprobe. In this paper we present the design and development of an advanced sample-scanning stage system prototype for an MLL-based hard x-ray nanoprobe. The design and prototyping activities for the Brookhaven NSLS-II nanopositioning system will also benefit the ongoing development of the Argonne CNM/APS MLL-based hard x-ray nanoprobe with hard x-ray focusing in the nanometer scale.
What problem does this paper attempt to address?