A Practical Micro Fringe Projection Profilometry for 3-D Automated Optical Inspection
Tianle Cheng,Xuewen Liu,Long Qin,Minghao Lu,Changyan Xiao,Shutao Li
DOI: https://doi.org/10.1109/tim.2022.3196738
IF: 5.6
2022-09-04
IEEE Transactions on Instrumentation and Measurement
Abstract:As an important defect detection technology, automated optical inspection (AOI) is widely used in the quality control of printed circuit board assembly (PCBA) and precision electronic manufacturing. To meet the requirement of 3-D AOI with large measurable volume, high speed, and high precision, a practical structured light imaging system based on the micro fringe projection profilometry is proposed. To be compatible with the traditional 2-D AOI system, an optical configuration with an axial bitelecentric lens camera and a lateral Scheimpflug projector is adopted, which helps to achieve a large depth of field (DOF). Adapting to the constraint of limited space for calibration target movement, a simplified and precise telecentric camera calibration method is proposed, which requires no auxiliary device such as micropositioning stage. Then, an improved bundle-adjustment method is introduced to globally optimize the calibration parameters. To accelerate the 3-D reconstruction, we further propose a ray backtracking algorithm after the corresponding point matching by using a modified telecentric camera model. It is demonstrated in experiments using real PCBA and microstructure components that the system DOF is 8 mm with a field of view of 32 mm mm. The reconstruction time is shortened to 40% of the traditional method.
engineering, electrical & electronic,instruments & instrumentation