In-Situ Tem Compression of Submicron-Sized Single Crystal Copper Pillars

X. D. Zhang,A. Godfrey,G. Winther,N. Hansen,X. Huang

2010-01-01

Abstract:In-situ TEM compression experiments of two submicron-sized single crystal copper pillars of identical initial orientations have been carried out using a state-of-the-art TEM holder (Picolndenter), which allows simultaneous recording of both the mechanical behavior and TEM images (microstructure or diffraction images). The stress-strain behavior shows that the strength of the pillars is higher than that of a coarse grained polycrystal but substantially lower than the theoretical strength. In order to couple the dislocation activity and the crystal rotation that occur during the compression, movies have been recorded under a dark field imaging condition for one pillar and under a convergent beam electron Kikuchi diffraction condition for the other. The diffraction condition for dark field imaging was defined to resolve the dislocations predicted to be active based on the assumption that the active slip systems in submicron-sized pillars are determined by the applied stress and the initial crystal orientation. The dark field imaging movie reveals dislocation generation, motion and bursts, providing evidence that the active slip systems are possibly the ones predicted. This suggestion is further substantiated by the crystal rotations determined from the Kikuchi diffraction observations.