Frequency Instability And Phase Noise Characterization Of An Integrated Chip-Scale Optomechanical Oscillator

yongjun huang,jiagui wu,xingsheng luan,shuwei huang,mingbin yu,guoqiang lo,dimlee kwong,guangjun wen,chee wei wong
DOI: https://doi.org/10.1364/cleo_si.2015.sth3i.7
2015-01-01
Abstract:We characterize the frequency instability and single-sideband phase noise of chip-scale optomechanically-driven oscillators, with integrated Ge photoreceivers. At 400-mu W, an open-loop frequency instability at 10(-8) is observed, with -125 dBc/Hz phase noise at 10kHz offset.
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