Thickness Determination of Silicon Detector and Calibration of CsI(Tl)

Wei Zhiyong,DUAN Limin,WU Heyu,Jin Genming,LI Zuyu,Zhang Baoguo,WANG Hongwei,Xiao Zhigang,LIU Yongying,WANG Sufang,ZHU Yongtai,HU Rongjiang
DOI: https://doi.org/10.3321/j.issn:0253-3219.2001.06.007
2001-01-01
Nuclear Techniques
Abstract:A method to determine the thickness of the Si semiconductor detector and calibrate the CsI(Tl) was developed using the maximum energy loss of charged particles emitted in nuclear reactions and their stopping power in Si semiconductor.
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