Magnetic And Electric Properties Of Fe3o4 Thin Films Sputtered On Metallic Underlayer

F Qin,Y Nozaki,K Matsuyama
2004-01-01
IEICE Transactions on Electronics
Abstract:High-quality Fe3O4 thin films have been fabricated onto metallic underlayers of Cr/Cu and Al by rf-magnetron sputtering at low substrate temperatures (< 573 K). The measured saturation magnetizations M-s are 462 emu/cm(3) for Al (50 nm)/Fe3O4 (200 nm) and 422 emu/cm(3) for Cr (45nm)/Cu (300nm)/Fe3O4 (200nm), which are markedly enhanced compared with that for the reference sample deposited directly on a glass substrate, and practically comparable to the bulk value of 477 emu/cm(3). Highly conductive transport with an order-disorder change of the Verwey transition was observed in the current-perpendicular-to-plane geometry. The order of decrease in coercive field was achieved by exchange coupling with an overlaid NiFe layer.
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