Luminescence and Lifetime Properties of Europium Doped Gallium Nitride Compatible with CMOS Technology

Poitras Carl B.,Lipson Michal,Wu Huaqiang,Spencer Michael G.
DOI: https://doi.org/10.1557/proc-866-v3.2
2005-01-01
Abstract:Continuous-wave and time resolved photoluminescence measurements on europium doped gallium nitride in the form of a powder are presented. The powder is obtained from reacting NH3 and a melt of gallium and europium with bismuth as a wetting agent. Photoluminescence from continuous wave excitation above the GaN bandgap reveals that an optimal concentration of about 1 at.% of Eu gives the most intense emission at 621 nm. Above gap time resolved photoluminescence reveals that energy transfer between the host material (GaN) and the rare earth ions occurs at a faster rate than previously reported for MBE grown GaN:Eu. Applications of the powder are directed towards CMOS compatible light emitters that are spun on silicon. A high temperature anneal of the powder shows no change in the CW photoluminescence spectrum of the powder, confirming CMOS compatibility.
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