Transport-Properties Of Indium Tin Oxide/P-Inp Structures

j k luo,hywel rhys thomas
DOI: https://doi.org/10.1063/1.108846
IF: 4
1993-01-01
Applied Physics Letters
Abstract:I-V properties of indium tin oxide (ITO)/p-InP solar cell structures measured at various temperatures show that the conduction mechanism is dominated by tunneling at low forward bias, and by thermionic emission at high forward bias. An increase of barrier height of 200-300 meV was found for all ITO/InP diodes compared with Au/InP Schottky diodes. Donorlike defects were found to be responsible for the increase of barrier height, and to cause the defect-assisted tunneling conduction. The experimental results support the model of a buried n+/p junction with the n+ layer induced by the sputter deposition of ITO.
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