Pulsed Atomic-Layer Epitaxy of Ultrahigh-Quality AlxGa1−xN Structures for Deep Ultraviolet Emissions below 230 Nm

JP Zhang,MA Khan,WH Sun,HM Wang,CQ Chen,Q Fareed,E Kuokstis,JW Yang
DOI: https://doi.org/10.1063/1.1528726
IF: 4
2002-01-01
Applied Physics Letters
Abstract:In this letter, we report the pulsed atomic-layer epitaxy of ultrahigh-quality AlN epilayers and AlN/Al0.85Ga0.15N multiple quantum wells (MQWs) on basal plane sapphire substrates. Symmetric and asymmetric x-ray diffraction (XRD) measurements and room-temperature (RT) photoluminescence (PL) were used to establish the ultrahigh structural and optical quality. Strong band-edge RT PL at 208 and 228 nm was obtained from the AlN epilayers and the AlN/Al0.85Ga0.15N MQWs. These data clearly establish their suitability for sub-250-nm deep UV emitters.
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