Force Modulation of Tunnel Gaps in Metal Oxide Memristive Nanoswitches

Feng Miao,J. Joshua Yang,John Paul Strachan,Duncan Stewart,R. Stanley Williams,Chun Ning Lau
DOI: https://doi.org/10.1063/1.3227651
IF: 4
2009-01-01
Applied Physics Letters
Abstract:Electron tunneling plays a key role in computing devices. Tunneling is, however, notoriously difficult to characterize inside real device structures. Using pressure modulated conductance microscopy, we demonstrate in situ angstrom-scale tuning and estimation of tunnel gaps with ∼10 nm lateral resolution. By modulating tunnel gaps in Pt/TiOx/Pt memristive oxide nanoswitches, we establish that these devices switch via 2–9 Å modification of the tunnel gap.
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