Abstract:The functionality of materials is determined by their composition and microstructure, that is, the distribution and orientation of crystalline grains, grain boundaries and the defects within them. The characterisation of the material's microstructure is therefore critical for materials applications such as catalysis, energy storage and buildings. Until now, characterization techniques that map the distribution of grains, their orientation, and the presence of defects have either been limited to surface investigations, to spatial resolutions of a few hundred nanometres, or to systems of thickness around one hundred nanometres, thus requiring destructive sample preparation for measurements and preventing the study of system-representative volumes or the investigation of materials under operational conditions. Here, we present X-ray linear dichroic orientation tomography, a quantitative, non-invasive technique that allows for an intra- and inter-granular characterisation of extended polycrystalline and amorphous materials in three dimensions (3D). We present the detailed characterisation of a polycrystalline sample of vanadium pentoxide (V2O5), a key catalyst in the production of sulfuric acid. In addition to determining the nanoscale composition, we map the crystal orientation throughout the polycrystalline sample with 73 nm spatial resolution. We identify grains, as well as twist, tilt, and twin grain boundaries. We further observe the creation and annihilation of topological defects promoted by the presence of volume crystallographic defects in 3D. Our method's non-destructive and spectroscopic nature opens the door to in-operando combined chemical and microstructural investigations of functional materials, including energy and mechanical materials in existing industries, as well as quantum materials for future technologies.

Rapid, All-Optical Crystal Orientation Imaging of Two-Dimensional Transition Metal Dichalcogenide Monolayers

Research Progress on the Preparations, Characterizations and Applications of Large Scale 2D Transition Metal Dichalcogenides Films

Monolayer Excitonic Emission for Imaging Spatial Dispersion of Photonic Crystals

Large Area Automated Characterisation of Chemical Vapour Deposition Grown Monolayer Transition Metal Dichalcogenides Through Photoluminescence Imaging

Observing Grain Boundaries in CVD-grown Monolayer Transition Metal Dichalcogenides.

Microstructure and Elastic Constants of Transition Metal Dichalcogenide Monolayers from Friction and Shear Force Microscopy

Ultra-fast Vacancy Migration: A Novel Approach for Synthesizing Sub-10 nm Crystalline Transition Metal Dichalcogenide Nanocrystals

Visualizing grain boundaries in monolayer MoSe 2 using mild H 2 O vapor etching

Periodical Ripening for MOCVD Growth of Large 2D Transition Metal Dichalcogenide Domains

X-ray Linear Dichroic Tomography of Crystallographic and Topological Defects

Substrate Lattice-Guided Seed Formation Controls the Orientation of 2D Transition-Metal Dichalcogenides

Direct CVD-growth and optoelectronic characterizations of monolayer ribbon-like MoS 2 flakes

Direct Optical-Structure Correlation in Atomically Thin Dichalcogenides and Heterostructures

Facile fabrication of 2D material multilayers and vdW heterostructures with multimodal microscopy and AFM characterization

Atom-by-atom imaging of moiré transformations in 2D transition metal dichalcogenides

Direct Visualization of Electric Field induced Structural Dynamics in Monolayer Transition Metal Dichalcogenides

Epitaxial Growth of 2D Layered Transition Metal Dichalcogenides

Non-epitaxial growth of highly oriented transition metal dichalcogenides with density-controlled twin boundaries

Characterization of 2D Transition Metal Dichalcogenides Through Anisotropic Exciton Behaviors (Small Methods 5/2024)

Transition metal dichalcogenide metaphotonic and self-coupled polaritonic platform grown by chemical vapor deposition

Three-Dimensional Orientation Mapping in the Transmission Electron Microscope