Formation and Electrical Bistability Properties of Zno Nanoparticles Embedded in Polyimide Nanocomposites Sandwiched Between Two C-60 Layers

Fushan Li,Tae Whan Kim,Wenguo Dong,Young-Ho Kim
DOI: https://doi.org/10.1063/1.2830617
IF: 4
2008-01-01
Applied Physics Letters
Abstract:The electrical bistability of the memory device based on ZnO nanoparticles embedded in a polyimide (PI) layer was investigated. Transmission electron microscopy and selected area electron diffraction pattern measurements showed that ZnO nanocrystals were formed inside the PI layer. Current-voltage measurements on Al∕C60∕ZnO nanoparticles embedded in PI layer/C60/indium tin oxide structures at 300K showed a current bistability with a large on/off ratio of 104. The current-voltage hysteresis characteristics at negative voltages could be modified by varying the applied positive erasing voltage. The memory device fabricated utilizing ZnO nanoparticles embedded in a PI layer exhibited excellent environmental stability at ambient conditions.
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