Ion Mixing of Metal/al Bilayers Near 77 K

E MA,TW WORKMAN,WL JOHNSON,MA NICOLET
DOI: https://doi.org/10.1063/1.100937
IF: 4
1989-01-01
Applied Physics Letters
Abstract:The efficiency of interfacial ion mixing is measured for metal/Al (metal=Ti, Cr, Ni, and Mo) thin-film bilayers irradiated with 285 keV Xe+ ions near 77 K. The results indicate that, as a group, mixing of 3d-metal/Al pairs irradiated by Xe can be explained by neither a pure binary collision cascade nor a pure thermal spike model. Such a situation should exist; that it should be found at the average atomic numbers of the present bilayers is consistent with recent theoretical predictions.
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