Stability And Crossover Of 71 Degrees And 109 Degrees Domains Influenced By The Film Thickness And Depolarization Field In Rhombohedral Ferroelectric Thin Films

c w huang,z h chen,junling wang,thirumany sritharan,lang chen
DOI: https://doi.org/10.1063/1.3607977
IF: 2.877
2011-01-01
Journal of Applied Physics
Abstract:The stability of domain patterns in rhombohedral ferroelectric films was studied using the minimum of free energy consisting of electrostatic and elastic energies. The converse piezoelectric effect due to the residual depolarization field was also considered. In the open-circuit condition, the 109 degrees domain is more stable than the 71 degrees one, which has a large depolarization field energy. By gradually decreasing the depolarization field energy, the stable domain pattern changes from 109 degrees to 71 degrees at a critical film thickness. This critical thickness of crossover from 109 degrees to 71 degrees domains is predicted to decrease with increasing residual depolarization field. (C) 2011 American Institute of Physics. [doi:10.1063/1.3607977]
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