Phase transitions, stability, and dielectric response of the domain structure in ferroelectric-ferroelastic thin films

A.M. Bratkovsky,A.P. Levanyuk
DOI: https://doi.org/10.1103/PhysRevLett.86.3642
2000-10-09
Abstract:We present the first analytical study of phase transitions in ferroelastic-ferroelectric epitaxial thin films on exactly solvable model. The emerging domain structure with domains of equal width (which may be exponentially large on a "soft" substrate) always remains stable irrespective of the film thickness. The dielectric response of an epitaxial film is {\em smaller} than that of a free film, in striking contrast with assertions in the literature.
Statistical Mechanics,Materials Science
What problem does this paper attempt to address?