Abstract:Subwavelength light sources have been constructed with the aid of luminescent and exciton transporting materials. These EXCITOR (exciton transmitted optical radiation) sources produce evanescent luminescence and can be used as scanning, light emitting tips of nanometer dimensions. They can also be used as scanning exciton donor tips. The theoretical resolution limit of this kind of near-field optical microscopy is on the atomic or molecular scale. The detection limit is a single molecule, but in contrast to other single molecule detection methods, this single molecule could be identified spatially as well as spectrally. Experimental examples of such an EXCITOR tip consist of gold or aluminum coated glass micropipettes with active crystal tips (anthracene, tetracene, perylene, etc.). Design considerations involve optical, excitonic, photochemical and mechanical properties of the luminescent point source. As it is scanned over a sample, it senses a variety of perturbations such as quenching or external heavy atom effects. It can also actively excite a luminescent probe. The latter process can be non-radiative (e.g., Forster) or may involve absorption and re-emission of evanescent luminescence. Spatially coupled emission and absorption processes are of both theoretical and practical interest. They open a way for reducing by many orders of magnitude the number of photons required to excite a single, isolated chromophore. Molecular exiton microscopy allows extention of near-field microscopy beyond the 50 nm limit already achieved and, thus, permits a new frontier of resolution with light based on the limits of energy transfer measurements. In essence, then, the goal of this research is a spectrally sensitive light microscope that will have the capability to zoom non-destructively and in air from the limits of resolution of lens-based confocal light microscopy (200 nm) to molecular dimensions of 1 nm.

Development Of A Scanning Minority-Carrier Transient Spectroscopy Technique With Optical-Injection And Full Transient Analysis

Femtosecond near-field scanning optical microscopy

Transient Scanning Electron Beam Annealing Methods Used to Study Diffusion and Defects in Implanted Silicon

Numerical Fitting of Transient Decays in the High Defect Density Limit

OPTIMIZATION OF THE IMAGING CONDITIONS FOR ELECTRON-BEAM AND LASER-BEAM EXCITED SCANNING DLTS INVESTIGATIONS

Transient Rayleigh scattering from single semiconductor nanowires

Measuring Minority Carrier Diffusion Length Using High-Injection Scanning Photocurrent Microscopy

Transport Electronique Dans Les Super Reseaux : Applications Aux Détecteurs Infrarouges à Grandes Longueur D'onde

Optimizing the sensitivity of high repetition rate broadband transient optical spectroscopy with modified shot-to-shot detection

Transient absorption microscopy setup with multi-ten-kilohertz shot-to-shot subtraction and discrete Fourier analysis

Scanning near-field optical spectroscopy and carrier transport based analysis in mesoscopic regions for two-dimensional semiconductors

Transient spectroscopy from time-dependent electronic-structure theory without multipole expansions

Scanning Exciton Microscopy and Single Molecule Resolution and Detection

Transient Rayleigh Scattering: A New Probe of Picosecond Carrier Dynamics in a Single Semiconductor Nanowire

Spatio-Temporal Electron Propagation Dynamics in Au/Fe/MgO(001) in nonequilibrium: Revealing Single Scattering Events and the Ballistic Limit

Single thermal scan digital system for deep level transient spectroscopy

A New Method for Determining the Generation Characteristics of the Minority Carrier--Transient Capacitance Relaxation Spectral Analysis Method

Development of Time-Domain Differential Raman for Transient Thermal Probing of Materials

Efficient and Continuous Carrier-Envelope Phase Control for Terahertz Lightwave-Driven Scanning Probe Microscopy

Attosecond transient grating spectroscopy with near-infrared grating pulses and an extreme ultraviolet diffracted probe

Characterization Study of Deep-Level Defect Spatial Distribution, Emission Mechanisms, and Structural Identification