Abstract:Raman spectroscopy-based temperature sensing usually tracks the change of Raman wavenumber, linewidth and intensity, and has found very broad applications in characterizing the energy and charge transport in nanomaterials over the last decade. The temperature coefficients of these Raman properties are highly material-dependent, and are subjected to local optical scattering influence. As a result, Raman-based temperature sensing usually suffers quite large uncertainties and has low sensitivity. Here, a novel method based on dual resonance Raman phenomenon is developed to precisely measure the absolute temperature rise of nanomaterial (nm WS2 film in this work) from 170 to 470 K. A 532 nm laser (2.33 eV photon energy) is used to conduct the Raman experiment. Its photon energy is very close to the excitonic transition energy of WS2 at temperatures close to room temperature. A parameter, termed resonance Raman ratio (R3) Omega = I-A1g/I-E2g , is introduced to combine the temperature effects on resonance Raman scattering for the A(1g) and E-2g modes. Omega has a change of more than two orders of magnitude from 177 to 477 K, and such change is independent of film thickness and local optical scattering. It is shown that when Omega is varied by 1%, the temperature probing sensitivity is 0.42 K and 1.16 K at low and high temperatures, respectively. Based on Omega, the in-plane thermal conductivity (k) of a similar to 25 nm-thick suspended WS2 film is measured using our energy transport state-resolved Raman (ET-Raman). k is found decreasing from 50.0 to 20.0 Wm(-1) K-1 when temperature increases from 170 to 470 K. This agrees with previous experimental and theoretical results and the measurement data using our EET-Raman. The R3 technique provides a very robust and high-sensitivity method for temperature probing of nanomaterials and will have broad applications in nanoscale thermal transport characterization, non-destructive evaluation, and manufacturing monitoring.

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Frequency-resolved Raman for Transient Thermal Probing and Thermal Diffusivity Measurement.

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Robust and High-Sensitivity Thermal Probing at the Nanoscale Based on Resonance Raman Ratio (R3)

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Thermal Characterization of Carbon Nanotube Fiber by Time-Domain Differential Raman

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Thermal Visualization of Buried Interfaces by Transient and Steady-State Responses of Time-Domain Thermoreflectance

Measurement of the Thermal Transport Properties of Dielectric Thin Films Using the Micro-Raman Method

Micron-Scale Measurements of the Coefficient of Thermal Expansion by Time-Domain Probe Beam Deflection

Thermal Visualization of Buried Interfaces Enabled by Ratio Signal and Steady-State Heating of Time-Domain Thermoreflectance

Suspended 2D Anisotropic Materials Thermal Diffusivity Measurements Using Dual-Wavelength Flash Raman Mapping Method

Raman-based Nanoscale Thermal Transport Characterization: A Critical Review

Micro/Nanoscale Thermal Characterization Based on Spectroscopy Techniques

Observation of Enhanced Heat Transfer Between a Nanotip and Substrate at Nanoscale Distances Via Direct Temperature Probing with Raman Spectroscopy

Laser Flash Raman Spectroscopy Method for Characterizing Thermal Diffusivity of Supported 2D Nanomaterials

The Ultrafast Laser Pump-Probe Technique for Thermal Characterization of Materials With Micro/Nanostructures

Frequency-domain probe beam deflection method for measurement of thermal conductivity of materials on micron length scale