Abstract:An embedded system implementing fringe encoding, image acquisition and algorithm processing has been recently designed and developed for 3D shape measurement based on structured light technology. Compared with traditional 3D shape measurement system, which has disadvantages of complex structure and slow processing speed, our embedded system is more effective in industrial quality detection. With self-developed digital micro projector based on liquid crystal on silicon, the structured light patterns are projected by high-resolution such as 720p. In the generated module of the stripes, we add a Gamma value to lower the projection error. Image acquisition sensor is synchronized with the micro projector by EP2C8 FPGA hardware circuits, which simultaneously control the phase encoding fringes according to different characteristic objects. To get high performance, accurate synchronization is crucial, especially in Phase Shifting Method, there are sequential images with shifting phases, in other words hardware circuit guarantee the processing speed before algorithm processing. We improved the three step phase algorithm, using the intensity modulation, which is a relatively simple method to solve the intensity imbalance of the three images. By implementing the digital signal processing (DSP) TMS320DM642 system, we realized three-dimensional measurement with a pipeline process of structure light encoding, image acquisition and three-dimensional reconstruction. Finally the measure experiment shows that the processing frame rate is up to 16 fps, and the measurement error is less than three percent. It means we can quickly and accurately detect three-dimensional profile with the portable device.

Design of a Three-Axis Surface Encoder with a Blue-Ray Laser Diode

A Sub-Nanometric Three-Axis Surface Encoder With Short-Period Planar Gratings For Stage Motion Measurement

A Novel Method to Simultaneously Measure the Straightness

Design and Testing of a Four-Probe Optical Sensor Head for Three-Axis Surface Encoder with a Mosaic Scale Grating

A Straightness Measurement System Using a Single-Mode Fiber-Coupled Laser Module

A compact design of optical scheme for multi-axis positioning surface encoders

A Compact Design of Optical Scheme for a Two-Probe Absolute Surface Encoders

A Six-Degree-of-freedom Surface Encoder for Precision Positioning of a Planar Motion Stage

Digitalization of Unknown Free-Form Surface Based on Variable-Direction Point Laser Sensor

A Liquid-Surface-Based Three-Axis Inclination Sensor for Measurement of Stage Tilt Motions

Fabrication of Scale Gratings for Surface Encoders by Using Laser Interference Lithography with 405 Nm Laser Diodes

Reduction of Crosstalk Errors in a Surface Encoder Having a Long Z-Directional Measuring Range

A multi-probe surface encoder for mosaic XY grating

Uncertainty analysis of a six-degree-of-freedom surface encoder for a planar motion stage

A Blu-Ray Laser Diode Based Dual-Beam Interference Lithography for Fabrication of Diffraction Gratings for Surface Encoders

Embedded Three-Dimensional Shape Measurement System with Microprojector

Measurement of Six-Degree-Of-Freedom Planar Motions by Using A Multiprobe Surface Encoder

Design and Construction of a Two-Degree-of-freedom Linear Encoder for Nanometric Measurement of Stage Position and Straightness

198 Laser Interference Lithography of Gratings for a Surface Encoder

Two-probe Optical Encoder for Absolute Positioning of Precision Stages by Using an Improved Scale Grating

A Two-Degree-of-freedom Linear Encoder with a Mosaic Scale Grating