Improvement Of A 500-Kev Heavy-Ion-Beam Probe For Jipp T-Iiu Tokamak

yasuji hamada,y kawasumi,a nishizawa,k narihara,t seki,k toi,haruo iguchi,akihide fujisawa,k adachi,akira ejiri,s hidekuma,s hirokura,k ida,k kawahata,masakazu kojima,k joong,r kumazawa,hideharu kuramoto,renrong liang,t minami,hajime sakakita,m sasao,k sato,teruhisa tsuzuki,jun xu,i yamada,taiji watari
DOI: https://doi.org/10.1063/1.1146399
IF: 1.6
1995-01-01
Review of Scientific Instruments
Abstract:Several improvements in the high‐voltage heavy‐ion‐beam probe (HIBP) are discussed. (1) It is clearly found that the precision slide mount of the detector plates 30° parallel to the base electrode is very effective for the determination of the in‐plane entrance angle of the beam in the analyzer to estimate the error in the potential measurement. (2) A two‐staged optical trap in the HIBP greatly reduced the effect of the UV radiation in the analyzer. (3) A multiple‐plate detector up to 13 measurement points clearly showed the direction of the propagation of the turbulence and path‐integral effects.
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