Raman Scattering Studies of Dilute InP1−xBixalloys Reveal Unusually Strong Oscillator Strength for Bi-induced Modes

Wenwu Pan,J. A. Steele,Peng Wang,Kai Wang,Yuxin Song,Li Yue,Xiaoyan Wu,Hao Xu,Zhenpu Zhang,Shijie Xu,Pengfei Lu,Liyuan Wu,Qian Gong,Shumin Wang
DOI: https://doi.org/10.1088/0268-1242/30/9/094003
IF: 2.048
2015-01-01
Semiconductor Science and Technology
Abstract:Room-temperature Raman scattering studies of new InP1-xBix alloys grown by molecular beam epitaxy are reported. Two new Bi-induced vibrations observed at 149 and 171 cm(-1) are assigned to InBi-like TO and LO phonon modes, respectively, and exhibit an unusually strong intensity for the dilute regime. Two additional modes at 311 and 337 cm(-1) are resolved as well with unknown origins. The Raman intensities of the InBi-like TO and LO bands, as well as the new mode at 337 cm(-1), exhibit strong and linear dependence on the Bi concentration for the composition range studied, 0.003 <= x <= 0.023. This correlation may serve as a fast and convenient means of characterizing bismuth composition not only in the ternary alloy InP1-xBix but also in the quaternaries such as In1-yGayP1-xBix and In1-yAlyP1-xBix.
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