Mobility Enhancement in Undoped Ge0.92Sn0.08quantum Well P-Channel Metal-Oxide-semiconductor Field-Effect Transistor Fabricated on (111)-Oriented Substrate

Yan Liu,Jing Yan,Mingshan Liu,Hongjuan Wang,Qingfang Zhang,Bin Zhao,Chunfu Zhang,Buwen Cheng,Yue Hao,Genquan Han
DOI: https://doi.org/10.1088/0268-1242/29/11/115027
IF: 2.048
2014-01-01
Semiconductor Science and Technology
Abstract:We report the dependence of the electrical performance on surface orientations of undoped Ge0.92Sn0.08 quantum well (QW) pMOSFETs on Ge(111) and (001) substrates. (111)-oriented Ge0.92Sn0.08 QW pMOSFETs show a peak μeff of 845 cm2V−1 s−1 and demonstrate a μeff improvement of 25% over (001)-oriented control at an inversion charge density of 5 × 1012 cm−2. We also report that undoped Ge0.92Sn0.08 QW pMOSFETs show a higher μeff than the doped GeSn devices reported in the literature. The high μeff achieved in undoped QW devices is enabled by incorporating high biaxial compressive strain (1.43%) and eliminating dopant impurity scattering in the defect-free channel.
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