X-ray Diffraction Analysis of Si02 Structure

B. Himmel,Th. Gerber,W. Heyer,W. Blau
DOI: https://doi.org/10.1007/bf01233136
IF: 4.5
1987-01-01
Journal of Materials Science
Abstract:The structural differences between vitreous silica and porous Si02 glass prepared by chemical extraction of Na20 · B203 · Si02 glasses were analysed by the method of X-ray diffraction. These investigations have given evidence for regularities of continuous silica networks beyond the well known short-range order which are discussed with respect to network topology. This network topology will be considered as cristobalite-like, as demonstrated by comparison with all corresponding crystalline modifications. The significant structural differences between vitreous and porous Si02 were attributed to a cristobalite-like topology with high- and low-temperature character, respectively. Both structures are separated by a displacive phase transition like theα−β transition in cristobalite. This phase transition was proved by temperature-dependentin situ measurements of X-ray scattering.
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