Analysis Of Temperature Effects On Maximum Power-Efficiency Of Pass Transistor Logic Networks In Low-Voltage Cmos

a k allam,o khanafshar,daniel y kwok,j rysinski,handong wang,c wickman,martin margala
DOI: https://doi.org/10.1109/CCECE.2000.849738
2000-01-01
Abstract:This paper presents a comprehensive analysis of the effects of increased temperature on maximum power-efficiency (power-delay-product) of pass-transistor networks operating at low supply voltages' using deep-submicron CMOS technology. Numerous gate functions,such as OR, NOR, AND, NAND, XOR and XNOR have been designed in Double Pass-Transistor Logic (DPL) and Swing-Restored Pass-Transistor Logic (SRPL). These circuits have been investigated under various operating conditions: fanin, fanout, power supply voltage and temperature. The results show that increased temperature significantly affects the maximum power-efficiency operating point of these logic gates and consequently, the optimum operating point.
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