In Situ Tuning of Switching Window in a Gate-Controlled Bilayer Graphene-Electrode Resistive Memory Device.

He Tian,Haiming Zhao,Xue-Feng Wang,Qian-Yi Xie,Hong-Yu Chen,Mohammad Ali Mohammad,Cheng Li,Wen-Tian Mi,Zhi Bie,Chao-Hui Yeh,Yi Yang,H-S Philip Wong,Po-Wen Chiu,Tian-Ling Ren
DOI: https://doi.org/10.1002/adma.201503125
IF: 29.4
2015-01-01
Advanced Materials
Abstract:A resistive random access memory (RRAM) device with a tunable switching window is demonstrated for the first time. The SET voltage can be continuously tuned from 0.27 to 4.5 V by electrical gating from -10 to +35 V. The gate-controlled bilayer graphene-electrode RRAM can function as 1D1R and potentially increase the RRAM density.
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