Investigation of GaInAs strain reducing layer combined with InAs quantum dots embedded in Ga(In)As subcell of triple junction GaInP/Ga(In)As/Ge solar cell.

Senlin Li,Jingfeng Bi,Mingyang Li,Meijia Yang,Minghui Song,Guanzhou Liu,Weiping Xiong,Yang Li,Yanyan Fang,Changqing Chen,Guijiang Lin,Wenjun Chen,Chaoyu Wu,Duxiang Wang
DOI: https://doi.org/10.1186/s11671-015-0821-7
2015-01-01
Nanoscale Research Letters
Abstract:The InAs/GaAs quantum dots structure embedded in GaInP/Ga(In)As/Ge triple junction solar cell with and without Ga0.90In0.10As strain reducing layer was investigated. Conversion efficiency of 33.91% at 1,000 suns AM 1.5D with Ga0.90In0.10As strain reducing layer was demonstrated. A 1.19% improvement of the conversion efficiency was obtained via inserting the Ga0.90In0.10As strain reducing layer. The main contribution of this improvement was from the increase of the short-circuit current, which is caused by the reduction of the Shockley-Read-Hall recombination centers. Consequently, there was a decrease in open circuit voltage due to the lower thermal activation energy of confined carriers in Ga0.9In0.1As than GaAs and a reduction in the effective band gap of quantum dots.
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