UV Sensing Using Film Bulk Acoustic Resonators Based on Au/n-ZnO/piezoelectric-ZnO/Al Structure.

Xiaolei Bian,Hao Jin,Xiaozhi Wang,Shurong Dong,Guohao Chen,J. K. Luo,M. Jamal Deen,Bensheng Qi
DOI: https://doi.org/10.1038/srep09123
IF: 4.6
2015-01-01
Scientific Reports
Abstract:A new type of ultraviolet (UV) light sensor based on film bulk acoustic wave resonator (FBAR) is proposed. The new sensor uses gold and a thin n-type ZnO layer deposited on the top of piezoelectric layer of FBAR to form a Schottky barrier. The Schottky barrier's capacitance can be changed with UV light, resulting in an enhanced shift in the entire FBAR's resonant frequency. The fabricated UV sensor has a 50 nm thick n-ZnO semiconductor layer with a carrier concentration of ~ 10 17 cm −3 . A large frequency downshift is observed when UV light irradiates the FBAR. With 365 nm UV light of intensity 1.7 mW/cm 2 , the FBAR with n-ZnO/Au Schottky diode has 250 kHz frequency downshift, much larger than the 60 kHz frequency downshift in a conventional FBAR without the n-ZnO layer. The shift in the new FBAR's resonant frequency is due to the junction formed between Au and n-ZnO semiconductor and its properties changes with UV light. The experimental results are in agreement with the theoretical analysis using an equivalent circuit model of the new FBAR structure.
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