Abstract:We developed a new platform that enables in-situ four-probe electronic measurements, in-situ three-probe field-effect measurements, nanomanipulation, and in-situ modification of nanodevices inside a transmission electron microscope (TEM). The platform includes a specially designed chip-holder and a silicon (Si) chip with suspended metal electrodes. The chip-holder can hold one Si chip with a size up to 3 mm x 3 mm and provides four electrical connections that can be connected to the micrometer-sized electrodes on the Si chip by wire-bonding. The other side of the electrical connections on the chip-holder is connected to the electronic instruments outside the TEM through a commercial Nanofactory SPM-TEM holder. The Si chip with suspended metal electrodes on one of its edges was fabricated by lithography and wet etching. Carbon nanotubes (CNTs), InAs nanowires, and tungsten disulfide nanowires were placed to stride over and connect to the suspended electrodes on the Si chip by nanomanipulations inside a scanning electron microscope (SEM). By using the platform, I-V curves of an individual single-walled CNT connecting to four electrodes were in-situ measured between any two of the four suspended electrodes, and a high-resolution TEM image of the same CNT was obtained. Furthermore, four-terminal I-V measurement on an InAs nanowire was achieved on this platform, and with a movable probe used as a gate electrode, field-effect measurement on the same InAs nanowire device was accomplished in SEM. In addition, by using the movable probe on the SPM-TEM holder, we could further in-situ modify nanomaterial and nanodevices. The present work demonstrates a method that allows a direct correlation between the atomic-level structure and the electronic property of nanomaterials or nanodevices whose structure can be further modified in-situ.

Note: A Quartz Cell With Pt Single Crystal Bead Electrode For Electrochemical Scanning Tunneling Microscope Measurements

Polished nanopipets: new probes for high-resolution scanning electrochemical microscopy.

Electrochemical Preparation of STM Probes for High Aspect Ratio Nanometrology

Systematic Study of Electropolishing Technique for Improving the Quality and Production Reproducibility of Tungsten STM Probe

A novel electrochemical atomic force microscope and its applications

A reproducible electropolishing technique to customize tungsten SPM probe: From mathematical modeling to realization

The Art of Electrochemical Etching for Preparing Tungsten Probes with Controllable Tip Profile and Characteristic Parameters

A Novel Atomic Force Microscope Operating in Liquid for in Situ Investigation of Electrochemical Preparation of Porous Alumina.

High-Percentage Success Method for Preparing and Pre-Evaluating Tungsten Tips for Atomic-Resolution Scanning Tunneling Microscopy

Electrochemical Etching-Assisted Fabrication of Quantum Tunneling Sensing Probes with Controlled Nanogap Width

Nanofabrication of the gold scanning probe for the STM-SECM coupling system with nanoscale spatial resolution

Systematic electrochemical etching of various metal tips for tunneling spectroscopy and scanning probe microscopy

Use of PtC Nanotips for Low-Voltage Quantum Tunneling Applications

Mesoporous PtIr alloy single-particle: A novel SECM-tip for in situ monitoring NO of single-cell

Titanium nitride microelectrode: a new candidate for in‐situ electrochemical transmission electron microscopy study

Fabrication of Nanometer-Sized Electrodes and Tips for Scanning Electrochemical Microscopy.

Sample Preparation Methodologies for In Situ Liquid and Gaseous Cell Analytical Transmission Electron Microscopy of Electropolished Specimens

A platform for in-situ multi-probe electronic measurements and modification of nanodevices inside a transmission electron microscope.

In Situ Cds Nanocluster Formation On Scanning Tunneling Microscopy Tips For Reliable Single-Electron Tunneling At Room Temperature

A low-temperature scanning probe microscopy system with molecular beam epitaxy and optical access

Preparation of light-atom tips for scanning probe microscopy by explosive delamination