Abstract:We demonstrate the fabrication of sharp nanopillars of high aspect ratio onto specialized atomic force microscopy (AFM) microcantilevers and their use for high-speed AFM of DNA and nucleoproteins in liquid. The fabrication technique uses localized charged-particle-induced deposition with either a focused beam of helium ions or electrons in a helium ion microscope (HIM) or scanning electron microscope (SEM). This approach enables customized growth onto delicate substrates with nanometer-scale placement precision and in-situ imaging of the final tip structures using the HIM or SEM. Tip radii of <10 nm are obtained and the underlying microcantilever remains intact. Instead of the more commonly used organic precursors employed for bio-AFM applications, we use an organometallic precursor (tungsten hexacarbonyl) resulting in tungsten-containing tips. Transmission electron microscopy reveals a thin layer of carbon on the tips. Consequently, the interaction of the new tips with biological specimens is likely very similar to that of standard carbonaceous tips, with the added benefit of robustness. A further advantage of the organometallic tips is that compared to carbonaceous tips they better withstand UV-ozone cleaning treatments to remove residual organic contaminants between experiments. Such contaminants are unavoidable during the scanning of soft biomolecules in liquid. Our tips can also be grown onto the blunted tips of previously-used cantilevers, thus providing a means to recycle specialized cantilevers and restore their performance to the original manufacturer specifications. Finally, a focused helium ion beam milling technique to reduce the tip radii and thus further improve lateral spatial resolution in the AFM scans is demonstrated.

Preparation of light-atom tips for scanning probe microscopy by explosive delamination

Electrochemical Preparation of STM Probes for High Aspect Ratio Nanometrology

Electron-Beam Tip/Sample Heating Device for A Scanning Tunneling Microscopy

Robust procedure for creating and characterizing the atomic structure of scanning tunneling microscope tips

High-Percentage Success Method for Preparing and Pre-Evaluating Tungsten Tips for Atomic-Resolution Scanning Tunneling Microscopy

Preparation Of Cantilevered W Tips For Atomic Force Microscopy And Apertureless Near-Field Scanning Optical Microscopy

Systematic electrochemical etching of various metal tips for tunneling spectroscopy and scanning probe microscopy

Microfabrication of Silicon Tip Structures for Multiple-Probe Scanning Tunneling Microscopy

Focused helium ion and electron beam induced deposition of organometallic tips for dynamic AFM of biomolecules in liquid

Plasma etching of superconducting Niobium tips for scanning tunneling microscopy

Site-specific femtosecond laser ablation: The pathway to high-throughput atom probe tomography characterization

Preparation of Fe STM tips for room-temperature spin-polarized tunneling spectroscopy

Fabrication of Tungsten Tip for Scanning Tunneling Microscope by the Lever Principle

Theoretical Study of Single-Atom Extraction Using STM

High-yield electrochemical etching of nanometrically defined Fe STM tips

The Art of Electrochemical Etching for Preparing Tungsten Probes with Controllable Tip Profile and Characteristic Parameters

Cleaning of tungsten tips for subsequent use as cold field emitters or STM probes

Optimization Of The Tip Of Microwave Afm Probe

Etch-stop method for reliably fabricating sharp yet mechanically stable scanning tunneling microscope tips

In Situ Sputtering From the Micromanipulator to Enable Cryogenic Preparation of Specimens for Atom Probe Tomography by Focused-Ion Beam

Use of PtC Nanotips for Low-Voltage Quantum Tunneling Applications