Long-term Academic Stress Increases the Late Component of Error Processing: an ERP Study

Wu Jianhui,Yuan Yiran,Duan Hongxia,Qin Shaozheng,Tony W. Buchanan,Zhang Kan,Zhang Liang
DOI: https://doi.org/10.1016/j.biopsycho.2014.03.002
IF: 3.111
2014-01-01
Biological Psychology
Abstract:Exposure to long-term stress has a variety of consequences on the brain and cognition. Few studies have examined the influence of long-term stress on event related potential (ERP) indices of error processing. The current study investigated how long-term academic stress modulates the error related negativity (Ne or ERN) and the error positivity (Pe) components of error processing. Forty-one male participants undergoing preparation for a major academic examination and 20 non-exam participants completed a Go-NoGo task while ERP measures were collected. The exam group reported higher perceived stress levels and showed increased Pe amplitude compared with the non-exam group. Participants' rating of the importance of the exam was positively associated with the amplitude of Pe, but these effects were not found for the Ne/ERN. These results suggest that long-term academic stress leads to greater motivational assessment of and higher emotional response to errors. (C) 2014 Elsevier B.V. All rights reserved.
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