Abstract:Terahertz waves are nondestructive and non-ionizing to synthetic and natural materials, including polymeric and biological materials. As a result, terahertz-based spectroscopy has emerged as a suitable technique to uncover fundamental molecular mechanisms and material properties in this electromagnetic spectrum regime. In terahertz time-domain spectroscopy (THz-TDS), the material's optical properties are resolved using the raw time-domain signals collected from the sample and air reference data depending on accurate prior knowledge of the sample geometry. Alternatively, different spectral analysis algorithms can extract the complex index of refraction of optically thick or optically thin samples without specific thickness knowledge. A THz-TDS signal without apparent Fabry–Pérot oscillations is commonly associated with optically thin samples, whereas the terahertz signal of optically thick samples exhibits distinct Fabry–Pérot oscillations. While several extraction algorithms have been reported a priori, the steps from reducing the time-domain signal to calculating the complex index of refraction and resolving the correct thickness can be daunting and intimidating while obscuring important steps. Therefore, the objective is to decipher, demystify, and demonstrate the extraction algorithms for Fabry–Pérot-absent and -present terahertz signals for various polymers with different molecular structure classifications and nonlinear optical crystal zinc telluride. The experimental results were in good agreement with previously published values while elucidating the contributions of the molecular structure to the stability of the algorithms. Finally, the necessary condition for manifesting Fabry–Pérot oscillations was delineated.

Accurate Determination of Terahertz Optical Constants by Vector Network Analyzer of Fabry-Perot Response

Measurement of the Group Refractive Index of Bulk Material Using White-Light Spectral Interferometry

Determination of the optical constants of polymer light-emitting diode films from single reflection measurements

A Spectroscopic Transmittance Analytical Modeling for Field-Widened Michelson Interferometer Employed by High Spectral Resolution Lidars

Photonic THz Frequency Domain Spectroscopy System with Attenuated Total Reflection

Methods for fast and accurate material properties estimate with terahertz time-domain spectroscopy in transmission and reflection with optically thick materials

Optical and Geometrical Properties from Terahertz Time-Domain Spectroscopy Data

Review and Modification of Permittivity Measurement on Open Resonator for Transparent Material Measurements at Terahertz

A Noniterative and Efficient Technique to Extract Complex Permittivity of Low-Loss Dielectric Materials at Terahertz Frequencies

Determination of the Optical Constants of Solar-Control Amorphous Silicon Thin Films on Float Glass

Complex Permittivity Characterization of Low-Loss Dielectric Slabs at Sub-THz

Enhancing Vector Network Analysis With a Photonic Frequency Extender Setup

An Improved Waveguide Method for Accurate Complex Permittivity Measurement of Medium/High-Loss Material

Simple, Fast, and Accurate Broadband Complex Permittivity Characterization Algorithm: Methodology and Experimental Validation from 140 GHz Up to 220 GHz

Complex Permittivity of Pure Water Measured by Vector Network Analysis at W-Band

Vector Network Analysis of Dielectric and Magnetic Materials in the Millimetre Wave Band

Precise Measurement of Refractive Index in the Ambient Environment Using Continuous-Wave Terahertz Frequency-Domain Spectroscopy (Thz-Fds)

Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration

Reduce the effects of Fabry-Perot interference and system dispersion in continuous wave terahertz coherence measurements with two optical-path differences

Influence of Window Function on Characterization of Materials in Terahertz Spectroscopy