Abstract:A method that ports the functionality of a macroscopic vector network analyzer, VNA, to the atomic scale is introduced. The approach pairs the unparalleled spatial resolution of a scanning tunneling microscope, STM, with microwave detection in the tunnel junction to enable phase‐resolved broadband microwave spectroscopy with atomic‐scale spatial resolution. Electronic devices have been ever‐shrinking toward atomic dimensions and have reached operation frequencies in the GHz range, thereby outperforming most conventional test equipment, such as vector network analyzers (VNA). Here the capabilities of a VNA on the atomic scale in a scanning tunneling microscope are implemented. Nonlinearities present in the voltage‐current characteristic of atoms and nanostructures for phase‐resolved microwave spectroscopy with unprecedented spatial resolution at GHz frequencies are exploited. The amplitude and phase response up to 9.3 GHz is determined, which permits accurate de‐embedding of the transmission line and application of distortion‐corrected waveforms in the tunnel junction itself. This enables quantitative characterization of the complex‐valued admittance of individual magnetic iron atoms which show a lowpass response with a magnetic‐field‐tunable cutoff frequency.

Vector Network Analysis of Dielectric and Magnetic Materials in the Millimetre Wave Band

300 GHz Vector Imaging System Based on Self-Mixing Detection

Development of a high-frequency dielectric spectrometer using a portable vector network analyzer

Complex Permittivity of Pure Water Measured by Vector Network Analysis at W-Band

Broadband Quasi-Optical Dielectric Spectroscopy for Solid and Liquid Samples

Millimeter-wave free-space dielectric characterization

Analysis of broadband microwave conductivity and permittivity measurements of semiconducting materials

Enhanced Rapid and Accurate Sub-Thz Magneto-Optical Characterization of Hexaferrite Ceramics

Automated and Precise Dielectric Measurement Systems at Millimeter Wavelengths Using Open Resonator Technique

Experimental Characterization of Hexaferrite Ceramics from 100 Ghz to 1 Thz Using Vector Network Analysis and Terahertz-Time Domain Spectroscopy

Integrated and Automated Dielectric Measurement System at Millimeter Wavelengths

Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope

An Atomic‐Scale Vector Network Analyzer

Open Resonator System for Automatic and Precise Dielectric Measurement at Millimeter Wavelengths

Challenges of Measuring the Complex Permittivity and Permeability of Thin Materials in Millimeter Wave Regimes (140Ghz–220ghz)

Dielectric microscopy with submillimeter resolution

A Portable Microwave Interferometry Sensor for Permittivity Detection Based on CCMRC.

Vector network analyzer measurement of the amplitude of an electrically excited surface acoustic wave and validation by X-ray diffraction

Microwave impedance microscopy and its application to quantum materials

Design and Simulation of Metamaterial Sensor and Numerical Formulation for Dielectric Properties