Reflectance Study of the Oscillator Strength of Excitons in Semiconductor Quantum Wells.

BP ZHANG,SS KANO,Y SHIRAKI,R ITO
DOI: https://doi.org/10.1103/physrevb.50.7499
1994-01-01
Abstract:The oscillator strength of excitons is investigated systematically in lattice-matched GaAs/AlxGa1-xAs, strained-well InxGa1-xAs/GaAs, and strained-well GaAs/GaAs1-xPx quantum wells (QW's) using Fourier-transform reflectance spectroscopy. The oscillator strength in GaAs/AlxGa1-xAs QW's increases as the well width is reduced, in agreement with the existing theory, while those in InxGa1-xAs/GaAs and GaAs/GaAs1-xPx QW's show a maximum at a certain well width. The well-width dependence of the band nonparabolicity and the overlap of the electron and hole wave functions is responsible for this behavior. The oscillator strengths in InxGa1-xAs/GaAs and GaAs/GaAs1-xPx QW's are differently dependent on the alloy composition; this is also explained in terms of the band nonparabolicity and the wave-function overlap. The temperature dependence of the oscillator strength in these structures is well described by a modified Debye-Waller expression with an averaged phonon mode. The exciton-phonon interaction, deduced from the temperature dependence of the oscillator strength of the zero-phonon line, is mainly determined by confined phonons in GaAs/AlxGa1-x As QW's, and by quasi-three-dimensional phonons in InxGa1-xAs/GaAs QW's.
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