Application of low temperature plasma modification explore the technical processing of nano HMX

xiaode guo,binbin dong,fengsheng li,zhixiang wang,fei wu
DOI: https://doi.org/10.1109/ACDT.2015.7111580
IF: 4.035
2015-01-01
Defence Technology
Abstract:Firstly, use the low temperature plasma equipment to process nano HMX. Then, use The dispersion and the morphology of nano HMX were characterized by Wet Zetasizer Nano and scanning electron microscope (SEM). Use fourier transform infrared spectrometer (FT-IY) and X-ray powder diffraction X-ray diffraction (XRD) and X-ray photoelectron spectrometer (XPS) to analyze its main composition, structure and surface element valence state changes. Finally, differential scanning calorimetry-thermogravimetric analysis (TG-DSC) to analyze the nanometer HMX thermal decomposition characteristics. Use the impact sensitivity test instrument to test its impact sensitivity. The result shows that treated nano HMX reunion reduce dispersion becomes better, treated nano HMX lower impact sensitivity of 8.1%, whitch improved its safety.
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