Threshold Voltage Extraction in the Saturation Regime Insensitive to the Contact Properties for Organic Thin-Film Transistors

Qingyu Cui,Cheng Gu,Jie Liu,Linrun Feng,Sui-Dong Wang,Xiaojun Guo
DOI: https://doi.org/10.1109/jdt.2014.2309860
2014-01-01
Journal of Display Technology
Abstract:In this work, the conventional threshold voltage ( Vth) extraction method assuming ohmic contacts in organic thin-film transistors (OTFTs) was shown to be difficult to obtain the intrinsic Vth values for devices with non-negligible contact properties. A simple Vth extraction method based on a modified analytical current-voltage expression in the saturation regime was thus proposed to exclude the influence of the contact properties. By applying the method to experimental devices of two different contacts, apparent Vth values close to the intrinsic values were obtained, which proved the method to be useful for accurate device characterization and modeling of OTFTs.
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