Microstructure evolution and growth kinetics of intermetallic compound in SAC305/Ag and SAC305/Cu solder joints during solid-state aging
Yuanming Chen,Junjie Huang,Yunzhong Huang,Qingyuan Li,Hong Zeng,Ling Tian,Jingsong Li,Shouxu Wang,Wei He,Yan Hong
DOI: https://doi.org/10.1007/s10854-024-12043-3
2024-02-07
Journal of Materials Science Materials in Electronics
Abstract:Microstructure evolution and growth kinetics of intermetallic compound (IMC) in Sn-3Ag-0.5Cu (SAC305) /Ag and SAC305/Cu solder joints were investigated during isothermal aging at temperatures of 140, 160, and 180 °C for up to 528 h. Top-view and cross-sectional images were analyzed to elucidate the transformation processes of Cu 6 Sn 5 and Ag 3 Sn grains on Cu and Ag substrates, respectively. In the top-view images, the Cu 6 Sn 5 grains on the Cu substrate, initially exhibiting a scallop-type morphology after reflow, transformed into hexagonal-type grains during isothermal aging. In contrast, the Ag 3 Sn grains formed on Ag substrate, characterized by a prism-type morphology after reflow, underwent a process of transformation from scallop-type to hexagonal-type grains. The cross-sectional images revealed the formation of a planar-type IMC layer on both the Ag and Cu substrates. In the SAC305/Cu joint, after the aging time, a double-layer structure was seen in the way of bottom Cu 3 Sn layer and top Cu 6 Sn 5 layer outside with many Ag 3 Sn tiny particles. However, in the condition of SAC305/Ag joint, only a few Cu 6 Sn 5 particles were observed around the surface of the Ag 3 Sn IMC with a single layer. Kinetic analyses showed that the control mechanism for IMC growth on both substrates was volume diffusion and the apparent activation energies for the IMC growth were calculated as 89.641 kJ/mol for the SAC305/Ag joint and 97.082 kJ/mol for the SAC305/Cu joint.
engineering, electrical & electronic,materials science, multidisciplinary,physics, condensed matter, applied