Abstract:The functionality of materials is determined by their composition and microstructure, that is, the distribution and orientation of crystalline grains, grain boundaries and the defects within them. The characterisation of the material's microstructure is therefore critical for materials applications such as catalysis, energy storage and buildings. Until now, characterization techniques that map the distribution of grains, their orientation, and the presence of defects have either been limited to surface investigations, to spatial resolutions of a few hundred nanometres, or to systems of thickness around one hundred nanometres, thus requiring destructive sample preparation for measurements and preventing the study of system-representative volumes or the investigation of materials under operational conditions. Here, we present X-ray linear dichroic orientation tomography, a quantitative, non-invasive technique that allows for an intra- and inter-granular characterisation of extended polycrystalline and amorphous materials in three dimensions (3D). We present the detailed characterisation of a polycrystalline sample of vanadium pentoxide (V2O5), a key catalyst in the production of sulfuric acid. In addition to determining the nanoscale composition, we map the crystal orientation throughout the polycrystalline sample with 73 nm spatial resolution. We identify grains, as well as twist, tilt, and twin grain boundaries. We further observe the creation and annihilation of topological defects promoted by the presence of volume crystallographic defects in 3D. Our method's non-destructive and spectroscopic nature opens the door to in-operando combined chemical and microstructural investigations of functional materials, including energy and mechanical materials in existing industries, as well as quantum materials for future technologies.

Mode Shape-Analysis Techniques Using Synchrotron X-Ray Topography

Lateral field excitation and coupled modes in AT quartz: synchrotron radiation X-ray topography

Investigation of the Spatial Distribution of Deformations in Quartz Piezo Elements by the X-Ray Topography Method

Quartz crystal microbalance based on torsional piezoelectric resonators.

Overtone frequency spectra for x3-dependent modes in AT-cut quartz resonators.

Lattice distortion and parameter variation in quartz and berlinite crystals: methods for improving the quality

High Harmonic Spectroscopy Probes Lattice Dynamics

Real-Space Visualization of Frequency-Dependent Anisotropy of Atomic Vibrations

Instrumentation for real-time x-ray topography

Sensing Performance Analysis on Quartz Tuning Fork-Probe at the High Order Vibration Mode for Multi-Frequency Scanning Probe Microscopy.

Ultrafast measurements of mode-specific deformation potentials of Bi$_2$Te$_3$ and Bi$_2$Se$_3$

Spectroscopic Line Shapes of Vibrational Quanta in the Presence of Molecular Resonances

Revealing subterahertz atomic vibrations in quantum paraelectrics by surface-sensitive spintronic terahertz spectroscopy

Near-Field Spectroscopy of Individual Asymmetric Split-Ring Terahertz Resonators

Frequency-Temperature Relations of Novel Cuts of Quartz Crystals for Thickness-Shear Resonators

Thickness-shear Vibration of AT-cut Quartz Plates Carrying Finite-Size Particles with Rotational Degree of Freedom and Rotatory Inertia [Correspondence]

Section methods of X-Ray diffraction topography

Vibrational Spectroscopy at Atomic Resolution with Electron Impact Scattering

Time-, Frequency-, and Wavevector-Resolved X-Ray Diffraction from Single Molecules

X-ray Linear Dichroic Tomography of Crystallographic and Topological Defects

High-harmonic spectroscopy probes lattice dynamics