Study on Fpga Seu Mitigation for Readout Electronics of Dampe Bgo Calorimeter

Zhongtao Shen,Changqing Feng,Shanshan Gao,Deliang Zhang,Di Jiang,Shubin Liu,Qi An
DOI: https://doi.org/10.1109/tns.2015.2427293
IF: 1.703
2015-01-01
IEEE Transactions on Nuclear Science
Abstract:The BGO calorimeter, which provides a wide measurement range of the primary cosmic ray spectrum, is a key sub-detector of the Dark Matter Particle Explorer (DAMPE). The readout electronics of calorimeter consists of 16 pieces of Actel ProASIC Plus FLASH-based field-programmable gate array (FPGA), of which the design-level flip-flops and embedded block random access memories (RAM) are single event upset (SEU) sensitive in the harsh space environment. To comply with radiation hardness assurance (RHA), SEU mitigation methods, including partial triple modular redundancy (TMR), CRC checksum, and multi-domain reset are analyzed and tested by the heavy-ion beam test. Composed of multi-level redundancy, a FPGA design with the characteristics of SEU tolerance and low resource consumption is implemented for the readout electronics.
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