Three-Dimensional Nanoscale Imaging of SiO2 Nanofiller in Styrene-Butadiene Rubber with High-Resolution and High-Sensitivity Ptychographic X-ray Computed Tomography

Naru Okawa,Nozomu Ishiguro,Shuntaro Takazawa,Hideshi Uematsu,Yuhei Sasaki,Masaki Abe,Kyosuke Ozaki,Yoshiaki Honjo,Haruki Nishino,Yasumasa Joti,Takaki Hatsui,Yukio Takahashi
DOI: https://doi.org/10.1093/mam/ozae094
IF: 4.0991
2024-09-21
Microscopy and Microanalysis
Abstract:SiO2 aggregates in styrene-butadiene rubber (SBR) were observed using ptychographic X-ray computed tomography (PXCT). The rubber composites were illuminated with X-rays focused by total reflection focusing mirrors, and the ptychographic diffraction patterns were collected using a CITIUS detector in the range of −75° to +75° angle of incidence. The projection images of the rubber composites were reconstructed with a two-dimensional resolution of 76 nm, and no significant structural changes were observed during the PXCT measurements. A three-dimensional image of the rubber composite was reconstructed with an isotropic resolution of 98 nm. Segmentation of SiO2 from the SBR, based on a histogram analysis of the phase shift, revealed a fragmented network structure of interconnected SiO2 aggregates.
materials science, multidisciplinary,microscopy
What problem does this paper attempt to address?