Empirical prediction model for Li/SOCl2 cells based on the accelerated degradation test.

Sijie Cheng,Zhongzhi Yuan,Xiangping Ye,Fuyi Zhang,Jincheng Liu
DOI: https://doi.org/10.1016/j.microrel.2014.09.031
IF: 1.6
2015-01-01
Microelectronics Reliability
Abstract:•Accelerated degradation test was performed on Li/SOCl2 cells.•The prediction model for residual capacity was established by using nonlinear curve fitting method based on the least square calculation.•Empirical capacity prediction model was found valid for a wide region of aging condition.
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